1:15 PM - 1:30 PM
[13p-B406-1] Temperature dependence of self-field critical current densities in YBCO thin films
Keywords:YBCO thin films, self-field critical current densities, temperature dependence
Temperature dependence of YBCO thin films containing a high-density of fine nanoprecipitates showed Jc(T) ~ (1 – T/Tc)m(1 + T/Tc)2, m ≈ 2.5 in B = 0.5–1 T, but the index m was smaller (1.5–1.7) in self-fields. Similar properties were observed in YBCO thin films containing a high-density of relatively-large nanoprecipitates and in Fluorine-free-MOD YBCO thin films containing stacking faults (SFs) and dislocation pins surrounding SFs. It is considered that the self-field Jc is determined by low-density of relatively-large nanoprecipitates.