The 67th JSAP Spring Meeting 2020

Presentation information

Oral presentation

3 Optics and Photonics » 3.3 Information photonics and image engineering

[13p-B415-1~14] 3.3 Information photonics and image engineering

Fri. Mar 13, 2020 1:15 PM - 5:00 PM B415 (2-415)

Tomoya Nakamura(Tokyo Tech), Teruyoshi Nobukawa(NHK Sci. & Tech. Res. Labs.)

2:30 PM - 2:45 PM

[13p-B415-6] Depth structure analysis by surface scanning in near-field microscope

Mayu Sao1, Satoru Takeda2, Yoshimasa Kawata2 (1.Shizuoka Univ CMMP, 2.Shizuoka Univ.)

Keywords:near-field microscope

Near-field optical microscope can observe sample surfaces with high resolution by scanning a small light spot; however, it cannot observe depth structures far away from a light source because a light spot spreads in depth direction. In this study, we propose the observation technique that can obtain depth information using two-dimensional intensity patterns which are obtained when a light source irradiates a sample. The technique analyzes depth structures by evaluating correlation coefficients between observed two-dimensional intensity patterns and calculated reference intensity patterns.