[13p-D215-1~6] New developments of surface properties and structural analysis by quantum beams

[13p-D215-4] Live observation of interface atomic layers by wavelength-dispersive CTR scattering

〇Tetsuroh Shirasawa¹ (1.AIST)

Keywords:X-ray CTR scattering, Electrode interface, Thin film growth process

X-ray crystal truncation rod (CTR) scattering is a powerful tool for studying the atomic structure of buried interfaces nondestructively. The analysis was often limited to the static structures, since the acquisition of CTR profile dataset is lengthy. We have developed a high-speed method which uses a wavelength-dispersive convergent X-rays, aiming for the in operando study of interface phenomena. We demonstrate the capability of the method by showing three examples of live observation of irreversible interface phenomena: electrochemical reaction on a Pt(111) electrode surface and a peculiar growth process of Bi thin film.