[13p-D519-1~12] 6.6 Probe Microscopy

[13p-D519-10] The evaluation of local signal and electrons emitted by inner-shell excitation using SR-STM

〇Hiroyuki Masumo^1,2, Akira Saito^1,2, Kazuma Fujii^1,2, Masaki Fujiwara^1,2, Kenji Tamasaku², Tetsuya Ishikawa², Yuji Kuwahara^1,2 (1.Osaka Univ, 2.RIKEN/SPring-8)

Keywords:synchrotron radiation, scanning tunneling microscopy

We developed synchrotron radiation (SR)-based STM (SR-STM) that enables to conduct the surface analysis in real space at nanoscale. However, it was difficult to perform the stable measurement due to the influence of electron emission. Thus, by the recent improvements of the measurement method, we succeeded in extracting of tunneling current modulation by increasing the S / N ratio. In the presentation, we will report on the element discrimination of Cu / Ge (111) interface and the noise component which is the key to analysis, mainly focusing on the dependence on measurement condition (incident X-rays and STM).