[13p-D519-1~12] 6.6 Probe Microscopy

△ [13p-D519-6] Structural identification of T phase of silicene on Ag(111) by atomic force microscopy

〇(M2)Lingyu Feng¹, Onoda Jo², Keisuke Yabuoshi¹, Yoshiaki Sugimoto¹ (1.The Univ. of Tokyo, 2.Univ. of Alberta)

Keywords:Atomic force microscopy, silicene

Silicene is a two-dimensional material with honeycomb structure. Recent years, silicene attracts lots of attention due to its out-standing electronic properties. Since silicene has a buckled structure, it is difficult to determine its exact atomic structure. Here, we report the atomic force spectroscopy observation of T phase of silicene on Ag(111). All the constituent Si atoms are successfully resolved by AFM imaging. Moreover, two kinds of T phase with different ordered patterns are found.