The 67th JSAP Spring Meeting 2020

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13 Semiconductors » 13.2 Exploratory Materials, Physical Properties, Devices

[14a-A202-1~8] 13.2 Exploratory Materials, Physical Properties, Devices

Sat. Mar 14, 2020 9:00 AM - 11:00 AM A202 (6-202)

Kosuke Hara(Univ. of Yamanashi)

9:00 AM - 9:15 AM

[14a-A202-1] Evaluation of crystalline quality of Mg2Si using high resolution XRD

〇Ryohei Masubuchi1, Yutaro Fuse1, Yoshiaki Hara2, Haruhiko Udono1 (1.Ibaraki Univ., 2.Ibaraki Tec College)

Keywords:semiconductor