9:30 AM - 9:45 AM
[14a-A205-1] Prediction and image mapping of electrical characteristics of crystal defects from photoluminescence profile using machine learning
Keywords:Machine learning, Semiconductor, Grain boundary
Oral presentation
Joint Session N "Informatics" » 23.1 Joint Session N "Informatics"
Sat. Mar 14, 2020 9:30 AM - 12:15 PM A205 (6-205)
Hideki Yoshikawa(NIMS), Takuto Kojima(Nagoya Univ.)
9:30 AM - 9:45 AM
Keywords:Machine learning, Semiconductor, Grain boundary