The 67th JSAP Spring Meeting 2020

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16 Amorphous and Microcrystalline Materials » 16.1 Fundamental properties, evaluation, process and devices in disordered materials

[14a-A407-1~8] 16.1 Fundamental properties, evaluation, process and devices in disordered materials

Sat. Mar 14, 2020 9:15 AM - 11:30 AM A407 (6-407)

Tamihiro Gotoh(Gunma Univ.), Toshihiro Nakaoka(Sophia Univ.)

10:45 AM - 11:00 AM

△ [14a-A407-6] Amplification circuit using a frequency-multiplying Ge-Sb-Te thin film

〇(M1)Yifei Yin1, Jiawen Xiang1, Hyoseong Park1, Hitoshi Hayashi1, Toshihiro Nakaoka1 (1.Sophia Univ. for Sophia University)

Keywords:Amplification circuit using a frequency-multiplying Ge-Sb-Te thin film