[14a-D209-1~10] 2.4 Accelerator Mass Spectrometry, Accelerator Beam Analysis

△ [14a-D209-6] Application to isotope analysis by laser resonant ionization of sputtered neutral mass spectrometry

〇(PC)Yue Zhao¹, Masato Morita¹, Tetsuo Sakamoto¹, Toshihide Kawai², Takeo Okumura², Kotaro Kato³, Volker Sonnenschein³, Hideki Tomita³, Yukihiko Satou⁴, Masabumi Miyabe⁴, Ikuo Wakaida⁴ (1.Kogakuin Univ., 2.JP Neutron Opt. Inc., 3.Nagoya Univ., 4.JAEA)

Keywords:TOF-SIMS, resonant ionization, laser

The method of laser ionization sputtered neutral particles in combination with TOF-SIMS is called sputtered neutral mass spectrometry (SNMS). We succeeded in multi-color resonant ionization using two laser wavelengths that matches the resonance level of the target atom. This multi-color resonant SNMS was possible to eliminate isobaric interference and measure the isotope ratio of the isotope elements approaching the detection limit.