The 67th JSAP Spring Meeting 2020

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.2 Carbon-based thin films

[14a-D221-1~12] 6.2 Carbon-based thin films

Sat. Mar 14, 2020 9:00 AM - 12:15 PM D221 (11-221)

Makoto Kasu(Saga Univ.), Hiroshi Kawarada(Waseda Univ.)

10:00 AM - 10:15 AM

[14a-D221-5] Crystalline quality of heteroepitaxial diamond substrates and their schottky barrier diode characteristics

Shinya Ohmagari1, Atsushi Kobayashi1, Nobuteru Tsubouchi1, Hideaki Yamada1 (1.AIST)

Keywords:diamond, heteroepitaxial, diode

SBD characteristics of heteroepitaxial diamond films have been reported. At room temperature, a high rectification ratio of more than 108 has been confirmed, but the non-uniformity in the crystal plane is large and the device characteristics vary widely. We have developed a metal-assisted termination (MAT) that improves the crystallinity by intentionally incorporating metal atoms during CVD growth. In this study, SBD characteristics before/after insertion of the MAT buffer layer was investigated.