[14a-PB6-1~17] 12.2 Characterization and Materials Physics

[14a-PB6-2] Investigation of Local Carrier Distributions in Organic Thin-Film Transistors using Kelvin-Probe Force Microscopy and Scanning Capacitance Force Microscopy (2)

〇(M1)Akito Tominami¹, Kei Kobayashi¹, Hirofumi Yamada¹ (1.Kyoto Univ.)

Keywords:Organic thin film transistor, Atomic force microscopy, Kelvin-probe force microscopy