[14p-D215-1~7] 【CS.5】 Code-sharing Session of 7.4 & 9.5

[14p-D215-2] X-ray energy dependence of an image of Ge quantum dot measured by XANAM

〇Shushi Suzuki¹, Shingo Mukai², Wang-Jae Chun³, Masaharu Nomura⁴, Syuntarou FUJIMORI¹, Mitsuhisa IKEDA¹, Katsunori MAKIHARA¹, Seiichi MIYAZAKI¹, Kiyotaka Asakura² (1.Nagoya Univ., 2.Hokkaido Univ., 3.ICU, 4.KEK-PF)

Keywords:Synchrotron Radiation X-ray, NC-AFM, Elemental Analysis

We have developed an X-ray aided noncontact atomic force microscope (XANAM) that combines NC-AFM and synchrotron radiation X-rays to study chemical analysis of sample surfaces at the nanoscale. We previously reported that Ge quantum dots under X-ray irradiation could be imaged. As the next step, we measured that the X-ray energy dependence of Ge quantum dot images and evaluated the spatial resolution of XANAM based on the results.