9:00 AM - 9:15 AM
[15a-D305-1] Peak-Tracking Scanning Thermal Noise Microscopy
Keywords:viscoelasticity, Young's modulus, subsurface structures
We recently developed (classical) scanning thermal noise microscopy (STNM), where the thermal noise spectra of the cantilever were measured at every pixels during the raster scan, from which the contact resonance frequency and quality factor (Q) images are reconstructed by the off-line analysis. In this presentation, we introduce the peak tracking (PT) technique, which allows us to simultaneously measure the contact resonance frequency and Q images, which correspond to the elasticity and viscosity, respectively, in real-time manner. Since the method is based on tracking of the amplitude maximum in the amplitude-frequency curve, it even works with the thermally driven cantilevers (PT-STNM). Here we demonstrate local viscoelastic measurements by PT-STNM, which is based on the contact-mode AFM but without excitation of the sample stage or the cantilever unlike the conventional viscoelastic measurement techniques.