The 67th JSAP Spring Meeting 2020

Presentation information

Oral presentation

3 Optics and Photonics » 3.8 Optical measurement, instrumentation, and sensor

[15p-B409-1~7] 3.8 Optical measurement, instrumentation, and sensor

Sun. Mar 15, 2020 1:15 PM - 3:00 PM B409 (2-409)

Minoru Tanabe(AIST)

2:30 PM - 2:45 PM

[15p-B409-6] Correlation-based Shack-Hartmann wavefront sensing: algorithm and simulation

Takao Endo1, Yoshichika Miwa1, Toshiyuki Ando1, Shigetaka Itakura2, Yasutaka Fujii2 (1.MELCO IT R&D Center, 2.MELCO Kamakura Works)

Keywords:Wavefront Sensing, Shack-Hartmann Sensor, Cross Correlation

A Shack-Hartmann wavefront sensor (SH-WFS) is one of the most common methods used to characterize the wavefront aberrations of an optical system. A conventional SH-WFS generally requires a single point source beacon as the reference wavefront. However, such a reference source is not generally available for remote imaging applications. For this reason, we are developing extended-scene SH-WFS for testing optics.
As a result of the verification test, we confirmed that the RMS error evaluated from the cross-correlation of the sub-image satisfy less than 1/50 pixel on our SH-WFS testbed. It corresponds to measure the fifth-order aberration of testing optics with an accuracy of 5/100λ.
In this paper, we discuss the correlation-based wavefront sensing algorithm and the preliminary results of the prototype SH-WFS.