Koichi Kakimoto

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Speaker, Author, Co-Author

Fri. Sep 10, 2021 9:00 AM - 11:45 AM N203 (Oral)

Oral presentation
| 15 Crystal Engineering
| 15.7 Crystal characterization, impurities and crystal defects

[10a-N203-1~10] 15.7 Crystal characterization, impurities and crystal defects

10:45 AM - 11:00 AM

[10a-N203-7] Growth angle dependence of Basal plane dislocation density in a PVT-SiC crystal

〇Koichi Kakimoto¹, Satoshi Nakano¹ (1.RIAM, Kyushu Univ.)