1:00 PM - 2:40 PM [23p-P10-1] Characterization of deep level defects in (111) B-doped CVD diamond films using the transient photocapacitance method 〇Osamu Maida1, Taishi Kodama1, Daisuke Kanemoto1, Tetsuya Hirose1 (1.Osaka Univ.)