Keiya Fujimoto

→ Search for Keiya Fujimoto in Google Scholar

Speaker, Author, Co-Author

Sun. Sep 12, 2021 9:00 AM - 11:45 AM N305 (Oral)

Oral presentation
| 13 Semiconductors
| 13.7 Compound and power devices, process technology and characterization

[12a-N305-1~10] 13.7 Compound and power devices, process technology and characterization

9:45 AM - 10:00 AM

[12a-N305-4] Transient internal temperature measurement of SiC-Schottky Barrier Diode using Optical-Interference Contactless Thermometry (OICT)

〇Keiya Fujimoto¹, Hiroaki Hanafusa¹, Takuma Sato¹, Seiichiro Higashi¹ (1.Hiroshima Univ.)