Shuhei Ichikawa

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Speaker, Author, Co-Author

Fri. Sep 10, 2021 9:00 AM - 11:45 AM N203 (Oral)

Oral presentation
| 15 Crystal Engineering
| 15.7 Crystal characterization, impurities and crystal defects

[10a-N203-1~10] 15.7 Crystal characterization, impurities and crystal defects

11:30 AM - 11:45 AM

[10a-N203-10] Precise detection of carrier lifetime limited by surface-recombination processes
in GaAs (110) using time-resolved two-photon photoemission spectroscopy

〇Shuhei Ichikawa^1,2, Hidehiro Yasuda^1,2 (1.Research Center for UHVEM, Osaka Univ., 2.Osaka Univ.)