[10a-N106-1~10] 3.8 Optical measurement, instrumentation, and sensor

[10a-N106-5] Spatially Resolved Complex Electric Field Spectroscopy of Multilayered Structure using SD-OCT by Kramers-Kronig analysis

〇Takahiro Kajiyama¹, Tatsutoshi Shioda¹ (1.Saitama Univ.)

Keywords:OCT

By utilizing the noninvasiveness, the research which applies the optical coherence tomography to not only biological field but also industrial field is advanced. Until now, we have proposed the tomographic spectroscopy which carries out the spectroscopy of every sample depth structure from tomographic image and the technique which separately measures complex refractive index and thickness. In this paper, the calculation formula which can measure even in the laminated sample is reported. As a demonstration, a monolayer sample was prepared, and calculation of each parameter and reproduction of the sample surface color (reflected object color) from the reflection spectrum were carried out.