Time-resolved measurement conducted by a newly developed 100-kV pulsed TEM using a photocathode-type electron source

Makoto Kuwahara; Lira Mizuno; Kojiro Nakakura; Masato Furui; Hideo Morishita; Takashi Ishida; Isao Nagaoki; Toshihide Agemura

Presentation information

Oral presentation

7 Beam Technology and Nanofabrication » 7.2 Applications and technologies of electron beams

[10a-N401-1~9] 7.2 Applications and technologies of electron beams

Fri. Sep 10, 2021 9:00 AM - 11:30 AM N401 (Oral)

Takafumi Ishida(Nagoya University), Aso Kohei(北陸先端大)

10:45 AM - 11:00 AM

[10a-N401-7] Time-resolved measurement conducted by a newly developed 100-kV pulsed TEM using a photocathode-type electron source

〇Makoto Kuwahara^1,2, Lira Mizuno², Kojiro Nakakura¹, Masato Furui², Hideo Morishita^3,2, Takashi Ishida^2,1, Isao Nagaoki⁴, Toshihide Agemura⁴ (1.IMaSS, Nagoya Univ., 2.Eng. Nagoya Univ., 3.Hitachi ltd., 4.Hitachi High-Tech)

Keywords:Time-resolved measurement, Transmission electron microscopy, Photocathode