[10p-N402-1~10] CS.1 Code-sharing Session of 2.3 & 7.5

[10p-N402-5] Cluster size dependence of the energy of secondary electrons emitted from a carbon foil by swift cluster-ion beam irradiation

〇Hidetsugu Tsuchida¹, Sohei Nakagawa¹, Naruki Uno¹, Takuya Majima¹, Manabu Saito¹ (1.Kyoto Univ.)

Keywords:Swift cluster ion beam, Secondary electron energy

The use of swift cluster ion beams as the primary beam for SIMS analysis increases secondary ion yield. In this study, we consider that secondary electron energy is involved in the increase in secondary ion yield, and investigate the cluster size dependence of the energy of secondary electrons emitted from a carbon foil by MeV-energy C_n⁺ (n ≤ 6) beam irradiation. We report experimental results that the emission of low-energy electrons (≤ 20 eV) was suppressed with increasing cluster size n.