[11a-N301-1~11] 6.6 Probe Microscopy

[11a-N301-9] AFM Measurement of Cuticular Layer Thickness of Coffee Leaves Reflecting Their Growth Conditions

〇(M2)Sayaka Kanetake¹, Yukihiro Takahashi², Tsuyoshi Hasegawa¹ (1.Waseda Univ., 2.Hokkaido Univ.)

Keywords:Atomic Force Microscope

On the surface of plant leaves, there is a thin protective film called the cuticular layer. This film is composed of cutin and wax, and plays a role in protecting the inside of the leaf from evaporation of water. In this study, we collected leaves from coffee bean trees grown in ambient air, and measured the thickness of the cuticular layer using atomic force microscopy (AFM) to correlate it with the growth conditions.