[11p-N323-1~13] 12.2 Characterization and Materials Physics

[11p-N323-10] Substituent Length Dependence in Interface Properties of Solution-Processed Alkyl-Substituted Phthalocyanine Thin Film

〇Takuma Shono¹, Daichi Tabuchi¹, Akihiko Fujii¹, Masanori Ozaki¹ (1.Osaka Univ.)

Keywords:organic semiconductor, kelvin probe force microscope, surface potential

To understand the interfacial properties of solution processed organic semiconductors and electrode materials, the alkyl phthalocyanine thin film on n-Si substrate was studied by Kelvin probe force microscopy. A surface potential difference changed depending on the film thickness. Moreover, the surface potential change near the substrate interface differed with the substituent lengths of the materials. When the substituent length is shortened, the effect of the interfacial dipole seems to increase due to the closer distance between the substrate and the core of the material with well-developed π-conjugation. Therefore, the different the surface potential change was shown depending on the substituent lengths.