The 82nd JSAP Autumn Meeting 2021

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.2 Carbon-based thin films

[12a-S301-1~11] 6.2 Carbon-based thin films

Sun. Sep 12, 2021 9:00 AM - 12:00 PM S301 (Oral)

Kazuhiro Oyama(DENSO)

9:00 AM - 9:15 AM

[12a-S301-1] Temperature sensitivity measurement using SiV centers in detonation nanodiamonds

Gaku Uchida1, Masanori Fujiwara1, Izuru Ohki1, Akihiko Tsurui2, Ming Liu2, Masahiro Nishikawa2, Norikazu Mizuochi1 (1.Kyoto Univ., 2.Daicel Corp.)

Keywords:SiV center, diamond, detonation

Nanodiamonds containing silicon-vacancy (SiV) centers are promising as a probe for measuring local temperature in living cells. Recently, we have produced nanodiamonds containing SiV centers by the detonation method (SiV-DND) which enables inexpensive and mass production, and reported that the fluorescence spectrum of SiV-DND shifts to the longer wavelength as temperature rises. In this study, we obtained SiV-DND with an average particle size of about 20 nm by classification, and estimated temperature sensitivity of them.