2:45 PM - 3:00 PM
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[12p-N205-5] Extraction of Electrode Contact Parameters from a Single Current-Voltage Curve:
A Case Study of a Rubrene Single Crystal Device with Switchable Electrode Contacts
Keywords:double Schottky, charge injection, barrier height switching
Metal-semiconductor (MS) junctions are mostly accompanied by charge injection barriers, and dominate the operation of a variety of electronic devices. However, the electrical characterization of MS junctions practically requires another metal electrode, and consequently, the consideration of metal-semiconductor-metal (MSM) junctions is inevitable. One of the authors (RN) has proposed a theoretical method to extract various parameters of two MS junctions from a single current-voltage curve of an MSM junction. In this work, this method was numerically simulated for various sets of parameters and the accuracy of the extracted parameters was evaluated for each set. In this talk, we will also present the results of the parameter extraction for water-induced switching of charge injection barriers in a rubrene single crystal device.