The 82nd JSAP Autumn Meeting 2021

Presentation information

Oral presentation

2 Ionizing Radiation » 2.4 Medical application

[13a-N206-1~9] 2.4 Medical application

Mon. Sep 13, 2021 9:00 AM - 11:30 AM N206 (Oral)

Hiroshi Muraishi(Kitasato Univ.)

10:45 AM - 11:00 AM

[13a-N206-7] Measurement results of soft errors caused by a medical carbon beam

〇(M2)Takahiro Matsumoto1, Kazutoshi Kobayashi1, Makoto Sakai2 (1.Kyoto Inst of Tech., 2.Gunma Univ.)

Keywords:Soft Error, FPGA, Heavy Ion Radiotherapy

When operating an electronic device in a radiation environment, radioactive particles hit a Silicon atom and generate electron-hole pairs, resulting a soft error in which memory data is flipped. With carbon beams used for cancer treatments, soft errors that occur in treatment equipments such as ICDs (Implantable Cardioverter Defibrillator) cause a serious issue. In this study, the number of soft errors caused by secondary particles generated by carbon beams in an FPGA was measured, and the soft error rate was estimated by Flux obtained from PHITS simulations.