9:30 AM - 9:45 AM
[13a-N304-3] Statistical analysis of characteristics variability in bulk MOSFETs at Low Temperatures
Keywords:MOSFET, cryogenic, variability
Characteristics variability of bulk MOSFETs at low temperature (LT) has statistically analyzed and compared with those at room temperature (RT). As a result, it was newly found that the DIBL variability increases at LT and the difference of threshold voltage between RT and LT follows the normal distribution.