The 82nd JSAP Autumn Meeting 2021

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6 Thin Films and Surfaces » 6.6 Probe Microscopy

[13p-N301-1~18] 6.6 Probe Microscopy

Mon. Sep 13, 2021 1:00 PM - 5:45 PM N301 (Oral)

Takashi Ichii(Kyoto Univ.), Keisuke Miyazawa(Kanazawa Univ.)

5:30 PM - 5:45 PM

[13p-N301-18] Peak-tracking capacitance force microscopy using triple bias modulation method

〇(DC)Ryota Fukuzawa1, Takuji Takahashi2 (1.IIS, The Univ. of Tokyo, 2.NanoQuine, The Univ. of Tokyo)

Keywords:Electrostatic force microscopy, surface states, C-V measurements