[23p-P11-1~25] 17 Nanocarbon Technology(Poster)

[23p-P11-23] Temperature and Gate voltage dependence of the contact resistance of electric double layer transistors with Ni/MoS₂ Junctions

〇Misato Inoue¹ (1.Japan Women's Univ.)

Keywords:MoS2, EDLT, Gate dependence