Session information

Poster presentation

15 Crystal Engineering » 15.7 Crystal characterization, impurities and crystal defects

[16p-P03-1~1] 15.7 Crystal characterization, impurities and crystal defects

Tue. Mar 16, 2021 1:00 PM - 1:50 PM P03 (Poster)

△：Presentation by Applicant for JSAP Young Scientists Presentation Award
▲：English Presentation
▼：Both of Above
No Mark：None of Above

1:00 PM - 1:50 PM

[16p-P03-1] Defect Analyses Using TEM of a-In₂O₃ Grown by Mist CVD on a-Al₂O₃Substrate

〇Yuka Hayakawa¹, Soichiro Ohno¹, Tomohiro Yamaguchi¹, Takanori Kiguchi², Subaru Takahashi¹, Yokoo Hirokazu¹, Takeyoshi Onuma¹, Tohru Honda¹ (1.Kogakuin Univ., 2.Tohoku Univ.)

Authenticate

Password Authentication

The password will be sent by email on February 26 to the early bird registrants.
To late registrants, The password will be sent in a registration confirmation email.

Please log in with your participant account.
» Participant Log In