[16a-Z34-1~11] CS.1 Code-sharing Session of 2.4 & 7.5

[16a-Z34-10] Study on Pulsed Vacuum Electrospray Droplet Ion Beams for TOF-SIMS Applications

〇Satoshi Ninomiya¹, Mikihiro Kawase¹, Tomu Sagami¹, Lee Chuin Chen¹, Kenzo Hiraoka¹ (1.Univ. of Yamanashi)

Keywords:electrospray, secondary ion mass spectrometry

We have studied to use a vacuum electrospray droplet ion (V-EDI) beam as a primary ion beam for time-of-flight secondary ion mass spectrometry (TOF-SIMS). In a general TOF-SIMS instrument, it is necessary to produce a shortly (< several tens of ns) pulsed primary ion beam, but it is impossible to produce a shortly pulsed V-EDI beam. Therefore, a preliminary research to produce a pulse source of the V-EDI beam was conducted.