[19a-P04-1~9] 8 プラズマエレクトロニクス(ポスター)

▲ [19a-P04-6] Development of an Ion Deflector in the Diagnostics of
Nanosecond Laser Ablation Plasmas

〇(D)James Edward Hernandez¹、Motoi Wada¹ (1.Doshisha Univ.)

キーワード：laser ablation, beam diagnostics, mass spectrometry

A deflection-type Time-of-Flight Mass Spectrometer (DTOFMS) is being developed for the characterization of nanosecond laser ablation plasmas. A Q-switched Nd:YAG laser (wavelength = 1064 nm, pulse repetition rate 10 Hz, spot size = 1 mm) is incident on a cylindrical graphite target surface at a 15º from the target normal. The DTOFMS consists of a hollow Faraday cup which collects initial distribution of the accelerated beam. The beam is then deflected towards a five-channel Faraday cup. The ion distributions of the pre- and post- deflection conditions are simultaneously collected by a high speed trigger oscilloscope. Simulations of the particle beam trajectory shows for a 2 keV beam a 6^o deflection from the beam axis corresponds to a 150 V deflector bias voltage.