[19p-Z19-1~7] 10.4 Semiconductor spintronics, superconductor, multiferroics

[19p-Z19-1] Thickness-dependence of structural and electronic characteristics of topological Bi_1-xSb_x thin films

Yasuhiro Hadate¹, Kazumasa Mori¹, Hidefumi Asano¹, 〇Kenji Ueda¹ (1.Nagoya Univ.)

Keywords:topological materials, Bi1-xSbx

In this research, we report on thickness-dependence of structural and electronic characteristics of topological Bi_1-xSb_x thin films toward electronic application of Bi_1-xSb_x.