The 83rd JSAP Autumn Meeting 2022

Presentation information

Oral presentation

15 Crystal Engineering » 15.7 Crystal characterization, impurities and crystal defects

[20a-C202-1~11] 15.7 Crystal characterization, impurities and crystal defects

Tue. Sep 20, 2022 9:00 AM - 12:00 PM C202 (C202)

Hidetoshi Suzuki(Miyazaki Univ.), Kazuhisa Torigoe(SUMCO)

9:45 AM - 10:00 AM

[20a-C202-4] Observation of Dislocation in Ge Single Crystal Substrates by X-ray Topography Using the Superbolman Effect

Yusuke Ito1, Kenta Takatsu1, Yoshiyuki Tsusaka1, Jyunji Matsui2 (1.Univ. of Hyogo, 2.Nano-Tech.Lab)

Keywords:X-ray, Topography