Sideband EFM, KPFM measurement of plasmon-induced charge separation on Au nano-particle/ TiO<sub>2</sub> interface

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.6 Probe Microscopy

Wed. Sep 21, 2022 1:30 PM - 4:30 PM C201 (C201)

4:00 PM - 4:15 PM

〇Tomoki Misaka¹, Hiroshi Ohyama¹, Takuya Matsumoto¹ (1.Osaka Univ.)

Keywords:Scanning probe microscopy, Plasmon, Nanoparticle