[22a-P03-1~11] 6.6 Probe Microscopy

[22a-P03-1] Development of tip-enhanced Raman spectroscopy based on liquid AFM

〇Lang Lang¹, Matsuura Tomohiko¹, Kominami Hiroaki¹, Zhang Kaifeng^1,2, Watanabe Masahiro², Kobayashi Kei¹ (1.Kyoto Univ., 2.Hitachi Ltd.)

Keywords:AFM, TERS

We have developed an indirectly irradiated TERS probe with a plasmon thin-film waveguide by processing the AFM cantilever tip with a focused ion beam. We are working on the development of an instrument that can perform AFM-TERS measurements in air and liquid using this probe.
As a result, TERS measurements on monolayers, which can only be measured by Raman spectroscopy using TERS, have been realised.