[22p-B102-1~10] Revisiting semiconductor light-emitting materials and optical characterization by unique spectroscopic approaches

[22p-B102-8] Terahertz time-domain spectroscopy and ellipsometry for optical physics research

〇Makoto Nakajima¹, Verdad Agulto¹, Toshiyuki Iwamoto^1,2 (1.ILE, Osaka Univ, 2.PNP)

Keywords:terahertz, ellipsomerty, wide-gap semiconductor

We developed a terahertz time domain ellipsometry and succeeded in improving the precision by more than an order by using the rotational analyzer method. We will report experimental results on conduction properties evaluation such as carrier densities up to 10²⁰ cm^-3 and mobility of wide-gap semiconductors by non-destructive and non-contact terahertz time domain ellipsometry.