[22p-B201-1~10] 10.1 Emerging materials in spintronics and magnetics (including fabrication and characterization methodologies)

▲ [22p-B201-2] Fabrication of Mn₄N ultrathin epitaxial films on SrTiO₃(001) substrates and evaluation of their roughness and magneto-transport properties

〇Taku Hirose¹, Taro Komori¹, Tomohiro Yasuda¹, Takumi Horiuchi¹, Kaoru Toko¹, Takashi Suemasu¹ (1.Tsukuba Univ.)

Keywords:Antiperovskite manganese nitride, Ultrathin film, Mn4N

We succeeded in the growth of flat Mn₄N ultrathin films on SrTiO₃(001) substrates. The Mn₄N thickness of samples, which is evaluated by X-ray reflection method, is less than 8.0 nm. We obtained well-squared anomalous Hall loops in perpendicular field by physical property measurement system and small roughness values by atomic force microscope. Especially, the roughness (root mean square) of 4.6-nm-thick Mn₄N sample is approximately 0.2 nm. These properties are advantageous for faster and more efficient domain wall motion in order to introduce spin-orbit torque and interfacial Dzyaloshinskii–Moriya interaction.