13:45 〜 14:00
▲ [22p-B201-2] Fabrication of Mn4N ultrathin epitaxial films on SrTiO3(001) substrates and evaluation of their roughness and magneto-transport properties
キーワード:Antiperovskite manganese nitride, Ultrathin film, Mn4N
We succeeded in the growth of flat Mn4N ultrathin films on SrTiO3(001) substrates. The Mn4N thickness of samples, which is evaluated by X-ray reflection method, is less than 8.0 nm. We obtained well-squared anomalous Hall loops in perpendicular field by physical property measurement system and small roughness values by atomic force microscope. Especially, the roughness (root mean square) of 4.6-nm-thick Mn4N sample is approximately 0.2 nm. These properties are advantageous for faster and more efficient domain wall motion in order to introduce spin-orbit torque and interfacial Dzyaloshinskii–Moriya interaction.