[22p-C106-1~16] 12.2 Characterization and Materials Physics

△ [22p-C106-9] Observation of Gap States in Polar Organic Thin Films
via Photoelectron Yield Measurements using Deep UV Light and Its Problems

〇(M1)Masaya Kitaoka¹, Nakazawa Ryotaro¹, Kaimori Ryota¹, Kurihara Keisuke¹, Watanabe Kenta¹, Ishii Hisao^1,2,3 (1.Chiba Univ GSSE, 2.Chiba Univ CFS, 3.Chiba Univ MCRC)

Keywords:semiconductor, photoelectron spectroscopy, polarity

In this study, we investigated photoelectron emission from typical OLED materials, Alq3 and TPBi, in detail and examined the origin of electron emission, which is thought to be BEE. When "photoelectron yield spectroscopy (PYS)" and "constant end-state photoelectron yield spectroscopy (CFSYS)," which are methods for measuring photoelectron yield in the deep UV region, are used to measure DOS at the in-gap states, the BEE phenomenon is considered to be an obstacle to the determination of the DOS of the initial state. Therefore, we also examined the problems to measure the DOS correctly by measuring PYS and CFSYS.