Local strain analysis of a single GaN-based quantum shell grown on a GaN substrate by using a three-dimensional reciprocal space map

Shoya Ota; Ryota Kobayashi; Nobuhiro Yasuda; Yasuhiko Imai; Tomoyo Nakao; Sigeo Arai; Koki Aoyama; Kazuki Nishimura; Satoshi Kamiyama; Daichi Imai; Takao Miyajima

Presentation information

Oral presentation

15 Crystal Engineering » 15.4 III-V-group nitride crystals

[23a-C200-1~11] 15.4 III-V-group nitride crystals

Fri. Sep 23, 2022 9:00 AM - 12:00 PM C200 (C200)

Hiroto Sekiguchi(Toyohashi Univ. of Tech.), Kenjiro Uesugi(Mie Univ.)

11:45 AM - 12:00 PM

[23a-C200-11] Local strain analysis of a single GaN-based quantum shell grown on a GaN substrate by using a three-dimensional reciprocal space map

〇Shoya Ota¹, Ryota Kobayashi¹, Nobuhiro Yasuda², Yasuhiko Imai², Tomoyo Nakao³, Sigeo Arai³, Koki Aoyama¹, Kazuki Nishimura¹, Satoshi Kamiyama¹, Daichi Imai¹, Takao Miyajima¹ (1.Meijo Univ., 2.JASRI, 3.Nagoya Univ.)

Keywords:X-ray nano beam, X-ray diffraction, nano wire