2022年第83回応用物理学会秋季学術講演会

講演情報

一般セッション(口頭講演)

4 JSAP-Optica-SPP Joint Symposia 2022 » 4.3 Lasers and laser materials processing

[23a-C205-1~6] 4.3 Lasers and laser materials processing

2022年9月23日(金) 09:30 〜 11:15 C205 (C205)

山下 真司(東大)

10:15 〜 10:30

[23a-C205-3] Numerical simulation on diffraction imaging with attosecond sources

Giang Nhan Tran1,2、Bing Xue1,2、Katsumi Midorikawa2、Eiji J. Takahashi1,3 (1.Ultrafast Coherent Soft X-ray Photonics Research Team, RIKEN Center for Advanced Photonics, RIKEN、2.Attosecond Science Research Team, RIKEN Center for Advanced Photonics, RIKEN、3.Extreme Laser Science Laboratory, RIKEN Cluster for Pioneering Research, RIKEN)

キーワード:attosecond source, diffraction imaging, ultrafast imaging

Coherent diffraction imaging is a lensless imaging method which uses phase retrieval algorithms to obtain wavelength scale resolution images. This method is usually performed at synchrotron or x-ray free-electron laser sources which are highly coherent and brilliant. The development of high harmonic generation source and recent emergence of attosecond sources open the opportunities to obtain high resolution images at laboratory scale. In this research, we have computationally demonstrated the possibility to recover the information of sample from broadband diffraction intensity. This opens the potential applications of attosecond sources for single shot diffraction imaging technique.
In this study, broadband diffraction intensities of different types of samples are generated at different levels of photon flux to explore the possibility to reconstruct the samples at different experimental conditions. The image reconstruction process was then performed using the combination of error reduction and hybrid input output algorithms. The results demonstrate that for current conditions of attosecond sources and these types of samples, the reliable information can be reliably recovered at the photon number higher than 108 photons/shot. This achieved results show the applicability of the developed attosecond sources with similar properties for diffraction imaging experiment.