[23a-C205-1~6] 4.3 Lasers and laser materials processing

▲ [23a-C205-6] Single Event Upset Induced by Femtosecond Pulse Laser on Digital Circuits

Pei-Kai Liao¹、Yu-Lin Chen¹、〇(M1)Shih-Bo Yu¹、Hsin-Shu Chen¹、Jia-Han Li¹ (1.Nat'l Taiwan Univ.)

キーワード：Single Event Upset, Radiation Hardening, Femtosecond Pulse Laser

Single event upset (SEU) is one of the electrical disturbances causing by the cosmic rays which could damage electronic device on the spacecraft. In order to prevent SEU from happening, standard test to the device chip is required in order to help engineer finding the best way to design the chip. In this work, a quantitative method to examine SEU based on femtosecond pulse laser is studied. With combination of oscilloscope, the chip performance could be observed clearly.