Retardation measurement of phase masks for exoplanet observations

Hiromi Muramatsu; Jun Nishikawa; Naoshi Murakami; Hiroaki Hayashi; Kenta Yoneta; Mizuki Asano; Yousuke Tanaka

Presentation information

Oral presentation

3 Optics and Photonics » 3.7 Optical measurement, instrumentation, and sensor (formerly 3.8)

[23p-C302-1~11] 3.7 Optical measurement, instrumentation, and sensor (formerly 3.8)

Fri. Sep 23, 2022 1:30 PM - 4:30 PM C302 (C302)

Toshihiro Somekawa(Inst. for Laser Tech.), Koyama Yuya(Chiba Institute of Technology)

3:30 PM - 3:45 PM

[23p-C302-8] Retardation measurement of phase masks for exoplanet observations

〇(M2)Hiromi Muramatsu¹, Jun Nishikawa^2,3,4, Naoshi Murakami⁵, Hiroaki Hayashi⁵, Kenta Yoneta², Mizuki Asano⁵, Yousuke Tanaka¹ (1.Tokyo Univ. of Agri. and Tech., 2.National Astronomical Observatory of Japan, 3.The Graduate Univ. for Advanced Studies, 4.Astrobiology Center, 5.Hokkaido Univ)

Keywords:Evaluation of phase masks, Evaluation of Photonic Crystal Functional Devices