[22p-P06-1~23] 17 ナノカーボン(ポスター)

▲ [22p-P06-6] Bias Dependence of STM Images Exhibiting Superstructures on Nanographene by First-principles Calculations

〇(D)Junhuan Li¹、Kentaro Kawai¹、Kouji Inagaki¹、Kazuya Yamamura¹、Kenta Arima¹ (1.Osaka Univ.)

キーワード：First-principles calculations, Graphene nanoribbon, Scanning tunneling microscopy

Peculiar electronic or chemical properties originating from local defects in graphene play an important role in various engineering fields. We have conducted atomic-scale scanning tunneling microscopy of nanographene formed on graphite, and a rectangular-like lattice was resolved. To clarify the origin of this unique rectangular lattice, the electron distribution in the occupied states of armchair-edged graphene nanoribbons was simulated based on first principles. For nanoribbons with a specific width, bright dots in the simulated images appear to form a rectangular lattice. Furthermore, we found that the images in this case were dependent on the sample bias, and the results were discussed.