[23a-F408-1~9] 16.1 Fundamental properties, evaluation, process and devices in disordered materials

[23a-F408-2] Silver photodiffusion into amorphous germanium sulfide - study on the local structure by XAFS and XPS measurements III

〇Yoshifumi Sakaguchi¹, Yuji Baba², Maria Mitkova³ (1.CROSS, 2.JAEA, 3.BSU (U.S.A.))

Keywords:amorphous chalcogenide, silver photodiffusion, local structural change

We investigated the silver photodiffusion kinetics into a chalcogenide layer by time-resolved neutron reflectivity measurements. In addition we measured S K-edge, Ge K-edge XAFS and XPS of Ag/ Ge₂₀S₈₀ exposed to the LED light with the peak wavelength at 408 nm to clarify the local structural changes in the silver photodiffusion process. In the presentation, we report the results of the XAFS and XPS of Ag/ Ge₂₀S₈₀ exposed to the LED light with the peak wavelength at 367 nm to study the excitation wavelength dependence of the local structural changes in the silver photodiffusion process.