[23p-D316-1~17] 13.6 ナノ構造・量子現象・ナノ量子デバイス

▲ [23p-D316-5] Lattice temperature dependence of electromigration process at Ni nanojunctions

〇Tian Yue¹、Shaoqing Du¹、Kazuhiko Hirakawa^1,2 (1.IIS, Univ. of Tokyo、2.INQIE,Univ. of Tokyo)

キーワード：electromigration, nanojunction