[24a-P01-1~71] 2 Ionizing Radiation(Poster)

[24a-P01-61] A comparison between neutron diffraction and EBSD images for a TlBr crystal

〇Kenichi Watanabe¹, Keitaro Hitomi², Mitsuhiro Nogami², Shigetaka Maeda³, Chikara Ito³, Takashi Tanno³, Hideaki Onabe⁴ (1.Kyushu Univ., 2.Tohoku Univ., 3.JAEA, 4.Raytech)

Keywords:TlBr semiconductor detector, neutron diffraction, EBSD

To evaluate the crystalline quality of a TlBr, which is developed as one of the room-temperature semiconductor detectors, the neutron diffraction and electron backscatter diffraction images were acquired. The images obtained by the both methods were compared.