6:15 PM - 6:30 PM
[24p-E106-18] Measurement of Pulsewidth Dependence of the Threshold Fluence of Dielectrics in Laser Ablation
Keywords:laser ablation, dielectrics
Oral presentation
3 Optics and Photonics » 3.7 Laser processing
Thu. Mar 24, 2022 1:30 PM - 6:30 PM E106 (E106)
Kotaro Obata(RIKEN), Seisuke Nakashima(Shizuoka Univ.), Takuro Tomita(Tokushima Univ.)
6:15 PM - 6:30 PM
Keywords:laser ablation, dielectrics