[25a-P06-1~5] 23.1 Joint Session N "Informatics"

[25a-P06-1] High-throughput electronic phase diagram analysis of ternary thin films using photoelectron emission microscopy

Ryosuke Sugita¹, 〇(B)Taiki Kasamatsu Kasamatsu¹, Kaito Kobayashi¹, Ryohei Seni¹, Ken Masuzawa¹, Syunsuke Sato¹, Mayuko Okada¹, Alexandre Foggiatto¹, Takuo Ohkouchi^2,3, Masato Kotsugi¹ (1.Tokyo Univ.of Sci, 2.JASRI, 3.RIKEN/Spring-8)

Keywords:Measurement Informatics